Steinmüller SO, Aydin H, Rein A, Korte C. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18O-tracer investigations on interface diffusion in Y2O3/YSZ multilayer systems. diffusion [Internet]. 2010 Jun. 1 [cited 2025 Apr. 10];12. Available from: https://diffusion.journals.qucosa.de/diffusion/article/view/383