LAUERER, Alexander; ZEIGERMANN, Philipp; LENZNER, Jörg; CHMELIK, Christian; VALIULLIN, Rustem; KÄRGER, Jörg. IR Micro-imaging of mesoporous silicon as a model system for the investigation of hysteresis phenomena. Diffusion Fundamentals, [S. l.], v. 20, 2013. DOI: 10.62721/diffusion-fundamentals.20.777. Disponível em: https://diffusion.journals.qucosa.de/diffusion/article/view/777. Acesso em: 4 apr. 2025.