SANGORO, Joshua Rume; IACOB, Ciprian; NAUMOV, Sergej; KÄRGER, Jörg; KREMER, Friedrich. Broadband dielectric spectroscopy as a tool to study diffusion coefficients in conducting glass-forming systems. Diffusion Fundamentals, [S. l.], v. 11, 2009. DOI: 10.62721/diffusion-fundamentals.11.539. Disponível em: https://diffusion.journals.qucosa.de/diffusion/article/view/539. Acesso em: 10 apr. 2025.