BELOVA, Irina V.; SHAW, David; MURCH, Graeme E. Limits of the ratios of tracer diffusivities for the vacancy-pair mechanism with application to compound semi-conductors. Diffusion Fundamentals, [S. l.], v. 11, 2009. DOI: 10.62721/diffusion-fundamentals.11.496. Disponível em: https://diffusion.journals.qucosa.de/diffusion/article/view/496. Acesso em: 10 apr. 2025.