STEINMÜLLER, Sven Ole; AYDIN, Halit; REIN, Alexander; KORTE, Carsten. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18O-tracer investigations on interface diffusion in Y2O3/YSZ multilayer systems. Diffusion Fundamentals, [S. l.], v. 12, 2010. DOI: 10.62721/diffusion-fundamentals.12.383. Disponível em: https://diffusion.journals.qucosa.de/diffusion/article/view/383. Acesso em: 10 apr. 2025.