SCHMIDT, Harald; HÜGER, Erwin; GEUE, Thomas; STAHN, Jochen; TIETZE, Ursula; LOTT, Dieter. Neutron Reflectometry – a tool to study self-diffusion on the (Sub)Nanometer scale in metastable materials. Diffusion Fundamentals, [S. l.], v. 12, 2010. DOI: 10.62721/diffusion-fundamentals.12.365. Disponível em: https://diffusion.journals.qucosa.de/diffusion/article/view/365. Acesso em: 10 apr. 2025.