Steinmüller, S.O. et al. 2010. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18O-tracer investigations on interface diffusion in Y2O3/YSZ multilayer systems. Diffusion Fundamentals. 12, (Jun. 2010). DOI:https://doi.org/10.62721/diffusion-fundamentals.12.383.