IR Micro-imaging of mesoporous silicon as a model system for the investigation of hysteresis phenomena

Authors

  • Alexander Lauerer
  • Philipp Zeigermann
  • Jörg Lenzner
  • Christian Chmelik
  • Rustem Valiullin
  • Jörg Kärger

DOI:

https://doi.org/10.62721/diffusion-fundamentals.20.777

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Published

2013-12-31

How to Cite

Lauerer, A., Zeigermann, P., Lenzner, J., Chmelik, C., Valiullin, R., & Kärger, J. (2013). IR Micro-imaging of mesoporous silicon as a model system for the investigation of hysteresis phenomena. Diffusion Fundamentals, 20. https://doi.org/10.62721/diffusion-fundamentals.20.777

Issue

Vol. 20 (2013): Special Issue "Diffusion Fundamentals V"

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-183825