Arsenic diffusivity study by comparison of post-Surface and post-implant diffusion in silicon with Local Density Diffusion (LDD-) model approximation

Authors

  • Frank Wirbeleit

DOI:

https://doi.org/10.62721/diffusion-fundamentals.15.570

Keywords:

arsenic, silicon, implant, diffusion, non-Gaussian diffusion model

Abstract

The LDD model was first applied to Arsenic concentration profiles determined in surface diffusion experiments by Yoshida and Arai [1]. The new method presented is based on a mathematical convolution with a delta-function-like concentration profile. By comparing the LDD approximation of post-surface diffusion with post-implant diffusion experiments, the same LDD model parameter r is found to hold for both experimental arrangements. This work found that post-implant diffusivity is concentration dependant and this might indicate an anomalous diffusion mechanism for Arsenic.

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Published

2011-11-01

How to Cite

Wirbeleit, F. (2011). Arsenic diffusivity study by comparison of post-Surface and post-implant diffusion in silicon with Local Density Diffusion (LDD-) model approximation. Diffusion Fundamentals, 15. https://doi.org/10.62721/diffusion-fundamentals.15.570

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