Broadband dielectric spectroscopy as a tool to study diffusion coefficients in conducting glass-forming systems

Authors

  • Joshua Rume Sangoro
  • Ciprian Iacob
  • Sergej Naumov
  • Jörg Kärger
  • Friedrich Kremer

DOI:

https://doi.org/10.62721/diffusion-fundamentals.11.539

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Published

2009-12-31

How to Cite

Sangoro, J. R., Iacob, C., Naumov, S., Kärger, J., & Kremer, F. (2009). Broadband dielectric spectroscopy as a tool to study diffusion coefficients in conducting glass-forming systems. Diffusion Fundamentals, 11. https://doi.org/10.62721/diffusion-fundamentals.11.539

Issue

Vol. 11 (2009): Special Issue “Diffusion Fundamentals III”

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-191093