Limits of the ratios of tracer diffusivities for the vacancy-pair mechanism with application to compound semi-conductors

Authors

  • Irina V. Belova
  • David Shaw
  • Graeme E. Murch

DOI:

https://doi.org/10.62721/diffusion-fundamentals.11.496

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Published

2009-12-31

How to Cite

Belova, I. V., Shaw, D., & Murch, G. E. (2009). Limits of the ratios of tracer diffusivities for the vacancy-pair mechanism with application to compound semi-conductors. Diffusion Fundamentals, 11. https://doi.org/10.62721/diffusion-fundamentals.11.496

Issue

Vol. 11 (2009): Special Issue “Diffusion Fundamentals III”

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-190042