The wealth of information from transient guest profiles

Authors

  • Tomas Binder
  • Christian Chmelik
  • Lars Heinke
  • Florian Hibbe
  • Jörg Kärger
  • Tobias Titze
  • Despina Tzoulaki

DOI:

https://doi.org/10.62721/diffusion-fundamentals.11.468

Abstract

The application of interference microscopy (IFM) and infrared microscopy (IRM) to monitor the evolution of the concentration of guest molecules in nanoporous host materials opens a new field of diffusion research in condensed matter. It combines the methodical virtues of the profiling methods of solid-state diffusion studies with the benefit of the mobility enhancement in fluids. We are going to illustrate the rich options of diffusion studies provided by this novel experimental approach.

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Published

2009-12-31

How to Cite

Binder, T., Chmelik, C., Heinke, L., Hibbe, F., Kärger, J., Titze, T., & Tzoulaki, D. (2009). The wealth of information from transient guest profiles. Diffusion Fundamentals, 11. https://doi.org/10.62721/diffusion-fundamentals.11.468

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