Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18O-tracer investigations on interface diffusion in Y2O3/YSZ multilayer systems

Authors

  • Sven Ole Steinmüller
  • Halit Aydin
  • Alexander Rein
  • Carsten Korte

DOI:

https://doi.org/10.62721/diffusion-fundamentals.12.383

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Published

2010-06-01

How to Cite

Steinmüller, S. O., Aydin, H., Rein, A., & Korte, C. (2010). Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18O-tracer investigations on interface diffusion in Y2O3/YSZ multilayer systems. Diffusion Fundamentals, 12. https://doi.org/10.62721/diffusion-fundamentals.12.383

Issue

Vol. 12 (2010): Special Issue "Spectroscopic Methods in Solid State Diffusion and Reactions

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-186982