In situ examination of Lanthanum Strontium Manganate (LSM) with Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Authors

  • Anne-Katrin Huber
  • Sven Ole Steinmüller
  • Eva Mutoro
  • Bjoern Luerßen
  • Jürgen Janek

DOI:

https://doi.org/10.62721/diffusion-fundamentals.12.381

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Published

2010-06-01

How to Cite

Huber, A.-K., Steinmüller, S. O., Mutoro, E., Luerßen, B., & Janek, J. (2010). In situ examination of Lanthanum Strontium Manganate (LSM) with Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Diffusion Fundamentals, 12. https://doi.org/10.62721/diffusion-fundamentals.12.381

Issue

Vol. 12 (2010): Special Issue "Spectroscopic Methods in Solid State Diffusion and Reactions

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-186860