Neutron Reflectometry – a tool to study self-diffusion on the (Sub)Nanometer scale in metastable materials

Authors

  • Harald Schmidt
  • Erwin Hüger
  • Thomas Geue
  • Jochen Stahn
  • Ursula Tietze
  • Dieter Lott

DOI:

https://doi.org/10.62721/diffusion-fundamentals.12.365

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Published

2010-06-01

How to Cite

Schmidt, H., Hüger, E., Geue, T., Stahn, J., Tietze, U., & Lott, D. (2010). Neutron Reflectometry – a tool to study self-diffusion on the (Sub)Nanometer scale in metastable materials. Diffusion Fundamentals, 12. https://doi.org/10.62721/diffusion-fundamentals.12.365

Issue

Vol. 12 (2010): Special Issue "Spectroscopic Methods in Solid State Diffusion and Reactions

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-186599