Secondary ion mass spectrometry and its application to diffusion in oxides

Roger A. De Souza; Manfred Martin

doi:10.62721/diffusion-fundamentals.12.363

Secondary ion mass spectrometry and its application to diffusion in oxides

Authors

Roger A. De Souza
Manfred Martin

DOI:

https://doi.org/10.62721/diffusion-fundamentals.12.363

Downloads

Published

2010-06-01

How to Cite

De Souza, R. A., & Martin, M. (2010). Secondary ion mass spectrometry and its application to diffusion in oxides. Diffusion Fundamentals, 12. https://doi.org/10.62721/diffusion-fundamentals.12.363

ACM
ACS
APA
ABNT
Chicago
Harvard
IEEE
MLA
Turabian
Vancouver

Download Citation

Endnote/Zotero/Mendeley (RIS)
BibTeX

Issue

Vol. 12 (2010): Special Issue "Spectroscopic Methods in Solid State Diffusion and Reactions

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-186567