Diffusion in nanopores recorded by microscopic measuring techniques

C. Chmelik; D. Freude; J. Haase; S. Hwang; J. Kärger; R. Valiullin

doi:10.62721/diffusion-fundamentals.32.1089

Diffusion in nanopores recorded by microscopic measuring techniques

Authors

C. Chmelik
D. Freude
J. Haase
S. Hwang
J. Kärger
R. Valiullin

DOI:

https://doi.org/10.62721/diffusion-fundamentals.32.1089

Keywords:

diffusion, microscopic measuring techniques, nanopores

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Published

2019-10-01

How to Cite

Chmelik, C., Freude, D., Haase, J., Hwang, S., Kärger, J., & Valiullin, R. (2019). Diffusion in nanopores recorded by microscopic measuring techniques. Diffusion Fundamentals, 32. https://doi.org/10.62721/diffusion-fundamentals.32.1089

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Issue

Vol. 32 (2019): Special Issue "Diffusion Fundamentals VIII"

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa2-386429

License

This work is licensed under a Creative Commons Attribution 4.0 International License.